A detailed description of the fine tuning of the track impact parameter
resolution can be found in the DELPHI
note 95-142 PHYS 567 (HTML) (PS
about 4.5MByte) by G.Borisov and C.Mariotti (published in NIM A 372 (1996)
181) and in DELPHI
note 97-96 PHYS 717 for the upgraded DELPHI micro vertex detector.
Some information on how to use the B confidence method, (
PS ) introduced in version 6.03, can be found here.